Proton-induced Auger electrons from ultrathin Mn films on Fe(100)

被引：22

作者：

Igel, T ^{[1
]}

Pfandzelter, R ^{[1
]}

Winter, H ^{[1
]}

机构：

[1] Humboldt Univ, Inst Phys, D-10115 Berlin, Germany

来源：

SURFACE SCIENCE | 1998年 / 405卷 / 2-3期

关键词：

Auger electron spectroscopy; ion-solid interactions; iron; manganese; single crystal epitaxy; thin film structures;

D O I：

10.1016/S0039-6028(97)00919-9

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Ultrathin Mn films are grown on Fe(100) and studied by Anger electrons induced by 25 keV protons scattered under grazing incidence from the film surface. The electron spectra indicate that significant interfacial alloying occurs juring growth of the first monolayer. Using model calculations we conclude that about 60% of the Mn atoms deposited have undergone place exchanges with Fe atoms from the substrate interface layer. Subsequent monolayers Brow as pure Mn films. These findings are supported by conventional electron-induced Anger electron spectroscopy. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：182 / 191

页数：10

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