Characterization of the sputtered-sliced zone plate for high energy X-rays

被引：2

作者：

Kamijo, N ^{[1
]}

Suzuki, Y

Awajia, M

Takeuchi, A

Uesugi, K

Yasumoto, M

Tamura, S

Kohmura, Y

Duevel, A

Rudolph, D

Schmahl, G

机构：

[1] Kansai Med Univ, Dept Phys, Hirakata, Osaka 5731136, Japan

[2] Osaka Natl Res Inst, Osaka 5638577, Japan

[3] Univ Gottingen, Inst Xray Phys, D-37073 Gottingen, Germany

[4] SPring8, Mikazuki, Hyogo 6795198, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 467卷

关键词：

Fresnel zone plate; hard X-ray microbeam; X-ray microscopy; synchrotron radiation;

D O I：

10.1016/S0168-9002(01)00501-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A zone plate for hard X-rays with outermost zone width as small as 30 nm and thickness similar to 14 mum fabricated by sputtered-sliced technology was evaluated. With the brilliant X-ray beam from the undulator at the SPring-8 the minimum focal spot size attained was similar to0.8 mum at the energy of 18.6keV. The intrinsic diffraction efficiency was determined to be similar to 12%. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：868 / 871

页数：4

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