Capacitance of semicondoctor-electrolyte junction and its frequency dependence

被引:33
作者
Wang, YB [1 ]
Yuan, RK [1 ]
Willander, M [1 ]
机构
[1] NANJING UNIV,DEPT PHYS,NANJING 210008,PEOPLES R CHINA
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1996年 / 63卷 / 05期
关键词
D O I
10.1007/BF01571678
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The frequency dependent capacitance of semiconductor-electrolyte junction and its relationship to the surface roughness of the semiconductor and the ions in the electrolyte are discussed. Due to very low mobility of the ions, the observed capacitance can be dominated by the Helmholtz double-layer of the electrolyte rather than the space charge layer of the semiconductor. The capacitance will also depend on the frequency. This, often observed power-law frequency dependence of capacitance is ascribed to the contribution of constant phase angle impedance. The power-law exponent can easily be related to the fractal dimension if the semiconductor surface can be described by fractal geometry.
引用
收藏
页码:481 / 486
页数:6
相关论文
共 29 条
[1]   ELECTROCHEMICAL CHARACTERISTICS OF INP/HCL INTERFACES [J].
BASLY, JP ;
ALLAIS, G .
MATERIALS LETTERS, 1990, 9 (11) :465-468
[2]  
BOCKRIS JO, 1977, MODERN ELECTROCHEMIS, pCH7
[3]  
BOTTELBERGHS PH, 1978, SOLID ELECTROLYTES, pCH10
[4]   THE CONSTANT PHASE-ANGLE IMPEDANCE OF THE FINITE SIERPINSKI ELECTRODE [J].
CHU, YT .
SOLID STATE IONICS, 1988, 26 (04) :299-302
[5]   MOTT-SCHOTTKY PLOTS AND FLAT-BAND POTENTIALS FOR SINGLE-CRYSTAL RUTILE ELECTRODES [J].
COOPER, G ;
TURNER, JA ;
NOZIK, AJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (09) :1973-1977
[6]   PHOTOELECTROCHEMICAL INVESTIGATION OF CDSIAS2 [J].
COTTING, T ;
VONKANEL, H ;
LEICHT, G ;
LEVY, F .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1989, 136 (02) :382-385
[7]   MEASUREMENT OF ROUGHNESS EXPONENT FOR SCALE-INVARIANT ROUGH SURFACES USING ANGLE-RESOLVED LIGHT-SCATTERING [J].
FANG, K ;
ADAME, R ;
YANG, HN ;
WANG, GC ;
LU, TM .
APPLIED PHYSICS LETTERS, 1995, 66 (16) :2077-2079
[8]  
FEDER J, 1988, FRACTALS, pCH14
[10]  
FREDLEIN RA, 1979, J ELECTROCHEM SOC, V126, P892