Adventures in attonewton force detection

被引:41
作者
Rugar, D. [1 ]
Stipe, B. C. [1 ]
Mamin, H. J. [1 ]
Yannoni, C. S. [1 ]
Stowe, T. D. [2 ,3 ]
Yasumura, K. Y. [2 ,3 ]
Kenny, T. W. [2 ,3 ]
机构
[1] IBM Corp, Almaden Res Ctr, Div Res, San Jose, CA 95120 USA
[2] Stanford Univ, Dept Appl Phys, Stanford, CA 94305 USA
[3] Stanford Univ, Dept Mech Engn, Stanford, CA 94305 USA
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2001年 / 72卷 / Suppl 1期
关键词
PACS: 07.79.Lh; 07.55.Jg; 62.25.+g; 75.50.Tt; 75.60.Ej;
D O I
10.1007/s003390100729
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We report detection of forces as small as 1.4 x 10(-18) N in a 1 Hz bandwidth using ultrathin silicon cantilevers operating at liquid helium temperatures. Cantilever fabrication, the importance of surface cleanliness and various measurement issues are discussed. Tip-surface interactions are described, including the detection of single electron trapping-untrapping events. Applications of attonewton force detection for single spin magnetic resonance force microscopy (MRFM) and ultrasensitive magnetometry are discussed.
引用
收藏
页码:S3 / S10
页数:8
相关论文
共 42 条
  • [1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY
    ALBRECHT, TR
    GRUTTER, P
    HORNE, D
    RUGAR, D
    [J]. JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) : 668 - 673
  • [2] The hierarchy problem and new dimensions at a millimeter
    Arkani-Hamed, N
    Dimopoulos, S
    Dvali, G
    [J]. PHYSICS LETTERS B, 1998, 429 (3-4) : 263 - 272
  • [3] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [4] Force-detected magnetic resonance in a field gradient of 250 000 Tesla per meter
    Bruland, KJ
    Dougherty, WM
    Garbini, JL
    Sidles, JA
    Chao, SH
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (21) : 3159 - 3161
  • [5] IRREVERSIBILITY AND GENERALIZED NOISE
    CALLEN, HB
    WELTON, TA
    [J]. PHYSICAL REVIEW, 1951, 83 (01): : 34 - 40
  • [6] Cavendish Henry, 1798, Philosophical Transactions ofthe Royal Society ofLondon, (part II), V88, P469, DOI DOI 10.1098/RSTL.1798.0022
  • [7] A nanometre-scale mechanical electrometer
    Cleland, AN
    Roukes, ML
    [J]. NATURE, 1998, 392 (6672) : 160 - 162
  • [8] LOCAL ELECTRICAL DISSIPATION IMAGED BY SCANNING FORCE MICROSCOPY
    DENK, W
    POHL, DW
    [J]. APPLIED PHYSICS LETTERS, 1991, 59 (17) : 2171 - 2173
  • [10] Magnetic dissipation force microscopy
    Grutter, P
    Liu, Y
    LeBlanc, P
    Durig, U
    [J]. APPLIED PHYSICS LETTERS, 1997, 71 (02) : 279 - 281