Magnetic dissipation force microscopy

被引：72

作者：

Grutter, P ^{[1
]}

Liu, Y ^{[1
]}

LeBlanc, P ^{[1
]}

Durig, U ^{[1
]}

机构：

[1] IBM CORP,DIV RES,ZURICH RES LAB,CH-8803 RUSCHLIKON,SWITZERLAND

来源：

APPLIED PHYSICS LETTERS | 1997年 / 71卷 / 02期

关键词：

D O I：

10.1063/1.119519

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A method of measuring magnetic dissipation on a sub-100 nm scale is presented. This technique relies on measuring changes in the damping of the oscillating tip in a magnetic force microscope (MFM). Damping contrast is strongly correlated with micromagnetic structure and in the case of NiFe, is in quantitative agreement with magnetoelastic losses in the sample. On recording tracks, large damping signals are observed. This has direct consequences on the interpretation of traditional MFM images acquired with detectors that convolute frequency and damping information. (C) 1997 American Institute of Physics.

引用

页码：279 / 281

页数：3

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