INTERACTION FORCE DETECTION IN SCANNING PROBE MICROSCOPY - METHODS AND APPLICATIONS

被引：129

作者：

DURIG, U

ZUGER, O

STALDER, A

机构：

[1] IBM Research Division, Zurich Research Laboratory

来源：

JOURNAL OF APPLIED PHYSICS | 1992年 / 72卷 / 05期

关键词：

D O I：

10.1063/1.352348

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Fundamental aspects of interaction force detection and force microscopy are discussed. A formalism is developed for studying the dynamics of experimental setups in general terms. The analysis focuses on stability criteria and resonant properties of the force sensor. The latter are important for measuring interaction force gradients. Experimental techniques used for interaction force detection are examined in detail. Finally, experimental results are presented that demonstrate the potential of combining atomic scale interaction force detection with scanning tunneling microscopy.

引用

页码：1778 / 1798

页数：21

共 47 条

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