Observation of microstructure and damage in materials by phase sensitive radiography and tomography

被引:446
作者
Cloetens, P
PateyronSalome, M
Buffiere, JY
Peix, G
Baruchel, J
Peyrin, F
Schlenker, M
机构
[1] RUCA,EMAT,ANTWERP,BELGIUM
[2] INSA,CREATIS,LYON,FRANCE
[3] INSA,GEMPPM,LYON,FRANCE
[4] INSA,CNDRI,LYON,FRANCE
[5] CNRS,LAB LOUIS NEEL,F-38042 GRENOBLE,FRANCE
关键词
D O I
10.1063/1.364374
中图分类号
O59 [应用物理学];
学科分类号
摘要
The novel possibilities of phase feature detection in radiography at a third generation synchrotron radiation source are used to image, both in projection and in computed tomography, a cracked silicon single crystal and metal matrix composites strained in tension, Through an instrumentally very simple technique, based on Fresnel diffraction, phase jumps related to the interface between the matrix and the reinforcing phases of the composites are detected even when these phases show very similar x-ray attenuation. Strain-induced cracks with openings below the micrometer range are also visible through the phase modulation they introduce, illustrating the potential of the technique for assessing damage in materials with improved resolution and sensitivity. (C) 1997 American Institute of Physics.
引用
收藏
页码:5878 / 5886
页数:9
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