Elastic backscattering spectroscopic microscopy

被引：58

作者：

Liu, Y ^{[1
]}

Li, X ^{[1
]}

Kim, YL ^{[1
]}

Backman, V ^{[1
]}

机构：

[1] Northwestern Univ, Dept Biomed Engn, Evanston, IL 60208 USA

来源：

OPTICS LETTERS | 2005年 / 30卷 / 18期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1364/OL.30.002445

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The spectral properties of elastic light-scattering signals have been shown to provide a wealth of information on nanostructures and microstructures. We present elastic backscattering spectroscopic microscopy that allows simultaneous acquisition of microscopic images and backscattering spectra at each pixel. Within a single homogeneous micrometer-scale particle we observe two distinct and highly localized spectral oscillation features that arise from different optical paths: (1) surface waves (e.g., the ripple structure) and (2) a not previously reported anomalous ripple structure that is due to the interference of waves scattered from front and back surfaces at the particle's center. We also demonstrate that the spectroscopic data can provide nanoscale structural information beyond what conventional microscopy reveals. (c) 2005 Optical Society of America.

引用

页码：2445 / 2447

页数：3

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