Interfaces and thin films as seen by bound electromagnetic waves

被引:832
作者
Knoll, W
机构
[1] Max Planck Inst Polymerforsch, D-55128 Mainz, Germany
[2] Stanford Univ, Ctr Polymer Interfaces & Macromol Assemblies, Dept Chem Engn, Stanford, CA 94305 USA
[3] Inst Phys & Chem Res, Frontier Res Program, Wako, Saitama 35101, Japan
关键词
evanescent wave optics; plasmon surface polaritons; guided optical waves; interfacial architectures; ultrathin organic films;
D O I
10.1146/annurev.physchem.49.1.569
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This contribution summarizes the use of plasmon surface polaritons and guided optical waves for the characterization of interfaces and thin organic films. After a short introduction to the theoretical background of evanescent wave optics, examples are given that show how this interfacial "light" can be employed to monitor thin coatings at a solid/air or solid/liquid interface. Examples are given for a very sensitive thickness determination of samples ranging from self-assembled monolayers, to multilayer assemblies prepared by the Langmuir/Blodgett/Kuhn technique or by the alternate polyelectrolyte deposition. These are complemented by the demonstration of the potential of the technique to also monitor time-dependent processes in a kinetic mode. Here, we put an emphasis on the combination set-up of surface plasmon optics with electrochemical techniques, allowing for the online characterization of various surface functionalization strategies, e.g. for (bio-) sensor purposes.
引用
收藏
页码:569 / 638
页数:70
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