Nature of electrical contacts in a metal-molecule-semiconductor system

被引:50
作者
Hsu, JWP [1 ]
Loo, YL [1 ]
Lang, DV [1 ]
Rogers, JA [1 ]
机构
[1] Bell Labs, Lucent Technol, Murray Hill, NJ 07974 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 04期
关键词
D O I
10.1116/1.1588641
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The effects of the top electrode fabrication method on the transport properties of Au-alkanedithiol-GaAs junctions are examined. We found that diodes made by evaporating An on 1,8-octanedithiol monolayer behave similarly to Au-GaAs junctions without the molecular layer. The direct AuGaAs contact dominates the electrical conduction in these evaporated devices despite the presence of the molecular layer. In contrast, Au-dithiol-GaAs diodes made by nanotransfer printing (nTP) exhibit no direct contact between An and GaAs. Electrical transport in the nTP junctions occurs through the 1,8-octanedithiol insulating layer. The low current levels and the high barrier-height values in the current-voltage results and the exponential energy dependence in the photoreponse yield that are observed in the nTP diodes support this conclusion. Since transport through the molecular layer is much less conductive, even a miniscule region of direct contact between the two electrodes will make it impossible to observe electrical transport through molecules. Fractional amounts of the different types of contacts for each kind of sample were obtained from the experimental results. (C) 2003 American Vacuum Society.
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收藏
页码:1928 / 1935
页数:8
相关论文
共 37 条
[1]   Formation of self-assembled monolayers of alkanethiols on GaAs surface with in situ surface activation by ammonium hydroxide [J].
Baum, T ;
Ye, S ;
Uosaki, K .
LANGMUIR, 1999, 15 (25) :8577-8579
[2]   Contact resistance in metal-molecule-metal junctions based on aliphatic SAMs: Effects of surface linker and metal work function [J].
Beebe, JM ;
Engelkes, VB ;
Miller, LL ;
Frisbie, CD .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2002, 124 (38) :11268-11269
[3]   Suppression of charge carrier tunneling through organic self-assembled monolayers [J].
Boulas, C ;
Davidovits, JV ;
Rondelez, F ;
Vuillaume, D .
PHYSICAL REVIEW LETTERS, 1996, 76 (25) :4797-4800
[4]   In situ formation, reactions, and electrical characterization of molecular beam epitaxy-grown metal/semiconductor interfaces [J].
Chen, LC ;
Caldwell, DA ;
Finstad, TG ;
Palmstrom, CJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1999, 17 (04) :1307-1312
[5]  
CONNELL GAN, 1979, AMORPHOUS SEMICONDUC, pCH4
[6]   Characterization of the interface dipole at organic/metal interfaces [J].
Crispin, X ;
Geskin, V ;
Crispin, A ;
Cornil, J ;
Lazzaroni, R ;
Salaneck, WR ;
Brédas, JL .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2002, 124 (27) :8131-8141
[7]   Bond insertion, complexation, and penetration pathways of vapor-deposited aluminum atoms with HO- and CH3O-terminated organic monolayers [J].
Fisher, GL ;
Walker, AV ;
Hooper, AE ;
Tighe, TB ;
Bahnck, KB ;
Skriba, HT ;
Reinard, MD ;
Haynie, BC ;
Opila, RL ;
Winograd, N ;
Allara, DL .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2002, 124 (19) :5528-5541
[8]   METAL OVERLAYERS ON SELF-ORGANIZED MOLECULAR ASSEMBLIES .4. ION-SCATTERING SPECTROSCOPY OF THE AG/CH3 INTERFACE [J].
HERDT, GC ;
CZANDERNA, AW .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1994, 12 (04) :2410-2414
[9]   Electron transport through thin organic films in metal-insulator-metal junctions based on self-assembled monolayers [J].
Holmlin, RE ;
Haag, R ;
Chabinyc, ML ;
Ismagilov, RF ;
Cohen, AE ;
Terfort, A ;
Rampi, MA ;
Whitesides, GM .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2001, 123 (21) :5075-5085
[10]   BIAS DEPENDENCE OF SCHOTTKY-BARRIER HEIGHT IN GAAS FROM INTERNAL PHOTOEMISSION AND CURRENT-VOLTAGE CHARACTERISTICS [J].
ISHIDA, T ;
IKOMA, H .
JOURNAL OF APPLIED PHYSICS, 1993, 74 (06) :3977-3982