Wetting reaction of Sn-Ag based solder systems on Cu substrates plated with Au and/or Pd layer

被引:24
作者
Liu, CY [1 ]
Li, J
Vandentop, GJ
Choi, WJ
Tu, KN
机构
[1] Intel Corp, Components Res, Chandler, AZ 85226 USA
[2] Univ Calif Los Angeles, Dept Mat Sci & Engn, Los Angeles, CA 90095 USA
基金
美国国家科学基金会;
关键词
Pb-free solder; wetting reaction; SnAg solder;
D O I
10.1007/s11664-001-0092-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The wetting behavior of SnAg based Pb-free solders on Cu and Cu substrates plated with Au, Pd, and Au/Pd thin films have been studied. The wetting angle and kinetics of interfacial reaction were measured. The Au-plated substrates exhibit better wetting than the Pd-plated substrates. In the case of SnAg on Pd-plated Cu, SEM observation revealed that the solder cap was surrounded by an inner ring of Cu-Sn compound and an outer ring of Pd-Sn compound. This implies that the molten SnAg solder had removed the Pd and wetted the Cu directly in the equilibrium state. The effects of pre-doping Cu in the SnAg solder on wetting behavior were also investigated. We found that wettability decreases with increasing Cu content in the solder. We also observed that the SnAgCu solders have a lower Cu consumption rate than the SnAg solder.
引用
收藏
页码:521 / 525
页数:5
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