Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic

被引:11
作者
Lee, WI
Young, RL
Chen, WK
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1996年 / 35卷 / 9B期
关键词
ZnO varistor; defect; deep level; DLTS; depth profile measurement;
D O I
10.1143/JJAP.35.L1158
中图分类号
O59 [应用物理学];
学科分类号
摘要
A method is proposed for performing deep level transient spectroscopy depth profile measurements of defects in polycrystalline ZnO. A multilayer-chip ZnO varistor structure is adopted to minimize the number of grains connected in series. It is verified that the distributions of some defects near the ZnO grain boundary are highly nonuniform. Valuable information has been obtained from the measured defect distribution profiles.
引用
收藏
页码:L1158 / L1160
页数:3
相关论文
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