Evolution of dislocations in perylene films with thickness and deposition rate

被引：15

作者：

Beigmohamadi, M. ^{[1
]}

Niyamakom, P. ^{[1
]}

Farahzadi, A. ^{[1
]}

Kremers, S. ^{[1
]}

Michely, T. ^{[1
]}

Wuttig, M. ^{[1
]}

机构：

[1] Rhein Westfal TH Aachen, Inst Phys, D-52056 Aachen, Germany

来源：

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | 2008年 / 2卷 / 01期

关键词：

D O I：

10.1002/pssr.200701221

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The growth of perylene films on an amorphous oxide bottom layer is investigated. The perylene films show clear spiral growth and formation of screw dislocations. As a function of deposition rate and film thickness the densities of screw dislocations, grains as well as the roughness and the lateral correlation length are determined from AFM images. The evolution of microstrain as calculated from an XRD peak profile analysis corresponds to the dislocation density. The simultaneous decrease of grain density and dislocation density with film thickness is explained by considering the overgrowth of grains due to loss of dislocations acting as growth spirals. (C) 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

引用

页码：1 / 3

页数：3

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