Critical currents Ic(77 k) > 350 A/cm-width achieved in ex situ YBCO coated conductors using a faster conversion process

被引：31

作者：

Feenstra, R ^{[1
]}

Gapud, AA

List, FA

Specht, ED

Christen, DK

Holesinger, TG

Feldmann, DA

机构：

[1] Oak Ridge Natl Lab, Oak Ridge, TN 37831 USA

[2] Los Alamos Natl Lab, Los Alamos, NM 87545 USA

[3] Univ Wisconsin, Ctr Appl Superconduct, Madison, WI 53706 USA

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2005年 / 15卷 / 02期

关键词：

BaF2 ex situ process; critical currents; thickness dependent effects; vortex pinning; YBCO coated conductors;

D O I：

10.1109/TASC.2005.848217

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Implementation of improved processing for BaF2 ex situ YBCO coatings from e-beam evaporated precursors enables faster conversion with rates up to 12 angstrom/s and critical currents I-c at 77 K greater than 350 A/cm-width on a RABiTS template. Details of the faster processing are described and compared to an earlier slower process. A linear relation between I-c and YBCO layer thickness provides evidence of new opportunities to further improve I-c.

引用

页码：2803 / 2807

页数：5

共 16 条

[1] EFFECT OF OXYGEN-PRESSURE ON THE SYNTHESIS OF YBA2CU3O7-X THIN-FILMS BY POSTDEPOSITION ANNEALING [J].