Far-infrared spectroscopy of a SrTiO3 thin film

被引：39

作者：

Fedorov, I ^{[1
]}

Zelezny, V ^{[1
]}

Petzelt, J ^{[1
]}

Trepakov, V ^{[1
]}

Jelinek, M ^{[1
]}

Trtik, V ^{[1
]}

Cernansky, M ^{[1
]}

Studnicka, V ^{[1
]}

机构：

[1] Acad Sci Czech Republ, Inst Phys, CZ-18040 Praha 8, Czech Republic

来源：

FERROELECTRICS | 1998年 / 208卷 / 1-4期

关键词：

spectroscopy; SrTiO3; thin film;

D O I：

10.1080/00150199808014890

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Far-infrared transmittance of a SrTiO3 thin film deposited on a sapphire substrate by laser ablation was measured in the frequency range 25-200 cm(-1) at temperatures from 5K up to 300 K. An interesting difference between the temperature behaviour of the polar soft mode in the thin him and the one in bulk material was observed. Below the structural transition near 105 K the mode stops softening and its damping increases on further cooling. The values of the total low-frequency permittivity in the film are substantially lower than those in bulk SrTiO3. The suggested explanation is based on the fact that the film contains relevant internal stress.

引用

页码：413 / 427

页数：15

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