Changes in surface stress at the liquid/solid interface measured with a microcantilever

被引:59
作者
Raiteri, R
Butt, HJ
Grattarola, M
机构
[1] Univ Mainz, Inst Phys Chem, D-55128 Mainz, Germany
[2] Univ Genoa, Dept Biophys & Elect Engn, I-16145 Genoa, Italy
关键词
atomic force microscopy; surface stress; cantilevers; biosensors; surface energy of solids;
D O I
10.1016/S0013-4686(00)00569-7
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The bending of microfabricated silicon nitride cantilevers was used to determine surface stress changes at solid-liquid interfaces. The radius of curvature of the bent. cantilever is directly proportional to changes in the differential surface stress between its opposite sides. To demonstrate the possibilities and limitations of the technique, cantilevers coated on both sides with gold and densely packed monolayers of different thiols were put in a constant flow of aqueous electrolyte solution and the deflection was measured using a optical lever technique. Changes in the surface stress for the different thiol monolayers due to specific proton adsorption are presented. Possible applications and improvements of this technique are discussed. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:157 / 163
页数:7
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