Low-energy high-flux nitriding of Ni and Ni20Cr substrates

被引:19
作者
Pedraza, F
Reffass, M
Abrasonis, G
Savall, C
Rivière, JP
Dinhut, JF
机构
[1] Univ Rochelle, LEMMA, F-17042 La Rochelle 1, France
[2] CNRS, LMP, UMR 6630, F-86962 Chasseneuil, France
关键词
nitriding; ion implantation; stainless steel; vickers microhardness; atomic force microscopy;
D O I
10.1016/S0257-8972(03)00735-7
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The influence of a low-energy high-flux nitrogen implantation on the structure and hardness of Ni and NiCr20 is examined. These implantation-diffusion experiments carried out at 475 and 450 degreesC, respectively, show that the nitriding process is very difficult for the pure Ni metal, whereas in the NiCr20 substrate the formation of an expanded austenite , phase is identified by X-ray diffraction. Vickers microhardness indentation tests indicate an important hardening effect of the NiCr20 substrate surface. The absence of any detectable nitridation effect in pure nickel substrates can be correlated with the low solubility of nitrogen. An increase in surface roughness and the presence of porosity is nevertheless observed by scanning electron microscopy and atomic force microscopy on both metallic substrates surfaces after the implantation process. This behaviour can be correlated with the sputtering effect produced by the very high implantation dose. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:236 / 242
页数:7
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