Consequences of Ti-, Li-, and Er-ion implantations on the optical properties of single layers of Ta2O5

被引:5
作者
Flory, F [1 ]
Berthier, D [1 ]
Rigneault, H [1 ]
Roux, L [1 ]
机构
[1] ION BEAM SERV,F-13850 GREASQUE,FRANCE
来源
APPLIED OPTICS | 1996年 / 35卷 / 25期
关键词
thin films; ion implantation; optical properties; guided waves; luminescence;
D O I
10.1364/AO.35.005085
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Tantalum pentoxide (Ta2O5) layers made by ion plating are implanted with a high fluence of keV Ti, Li, and Er ions. The resulting refractive-index profiles are given from the analysis of guided-wave propagation conditions. A comparison with spectrophotometric measurements is presented. All the implanted layers present low losses (extinction coefficient of some 10(-6)) after thermal annealing in air. Ti-implanted layers exhibit an increase in refractive index, whereas Li- and Er-implanted layers present a slight decrease in refractive index. Er-implanted layers present photoluminescent properties. (C) 1996 Optical Society of America
引用
收藏
页码:5085 / 5090
页数:6
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