Infinite family of persistence exponents for interface fluctuations

被引：29

作者：

Constantin, M ^{[1
]}

Das Sarma, S

Dasgupta, C

Bondarchuk, O

Dougherty, DB

Williams, ED

机构：

[1] Univ Maryland, Dept Phys, Condensed Matter Theory Ctr, College Pk, MD 20742 USA

[2] Univ Maryland, Dept Phys, Mat Res Sci & Engn Ctr, College Pk, MD 20742 USA

[3] Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India

来源：

PHYSICAL REVIEW LETTERS | 2003年 / 91卷 / 08期

关键词：

D O I：

10.1103/PhysRevLett.91.086103

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We show experimentally and theoretically that the persistence of large deviations in equilibrium step fluctuations is characterized by an infinite family of independent exponents. These exponents are obtained by carefully analyzing dynamical experimental images of Al/Si(111) and Ag(111) equilibrium steps fluctuating at high (970 K) and low (320 K) temperatures, respectively, and by quantitatively interpreting our observations on the basis of the corresponding coarse-grained discrete and continuum theoretical models for thermal surface step fluctuations under attachment/detachment ("high-temperature") and edge-diffusion limited kinetics ("low-temperature"), respectively.

引用

页数：4

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