Oxygen photoevolution on a tantalum oxynitride photocatalyst under visible-light irradiation: How does water photooxidation proceed on a metal-oxynitride surface?

被引:95
作者
Nakamura, R [1 ]
Tanaka, T [1 ]
Nakato, Y [1 ]
机构
[1] Osaka Univ, Grad Sch Engn Sci, Div Chem, Toyonaka, Osaka 5608531, Japan
关键词
D O I
10.1021/jp0501289
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The mechanism of water photooxidation (oxygyen photoevolution) on a TaON photocatalyst was studied on the basis of our previous studies on the mechanism of this reaction on TiO2, and N-doped TiO2. We have confirmed that photocatalytic O-2 evolution occurs from an aqueous TaON suspension in the presence of Fe3+, as reported. In-situ MIR-IR experiments have indicated that the TaON surface is slightly oxidized under visible-light irradiation, indicating that the oxygen photoevolution on TaON actually occurs on a thin Ta-oxide overlayer. The in-situ MIR-IR experiments have also shown that a certain surface peroxo species, tentatively assigned to adsorbed HOOH, is formed as an intermediate of the O-2 photoevolution reaction. Studies on the effect of addition of reductants to the electrolyte on the IPCE have shown that photogenerated holes at the TaON surface cannot oxidize reductants such as SCN-, Br-, methanol, ethanol, 2-propanol, and acetic acid, though they can oxidize H2O into O-2. Detailed considerations of these results have strongly suggested that the water photooxidation reaction on TaON proceeds by our recently proposed new mechanism, that is, the reaction is initiated by a nucleophilic attack of a water molecule (Lewis base) on a surface-trapped hole (Lewis acid).
引用
收藏
页码:8920 / 8927
页数:8
相关论文
共 46 条
  • [1] Visible-light photocatalysis in nitrogen-doped titanium oxides
    Asahi, R
    Morikawa, T
    Ohwaki, T
    Aoki, K
    Taga, Y
    [J]. SCIENCE, 2001, 293 (5528) : 269 - 271
  • [2] Comparative investigation of hydrogen bonding in silicon based PECVD grown dielectrics for optical waveguides
    Ay, F
    Aydinli, A
    [J]. OPTICAL MATERIALS, 2004, 26 (01) : 33 - 46
  • [3] Study of the chemistry of NH3 on aluminum nitride and oxynitride under steady-state conditions using external-reflection infrared spectroscopy
    Bermudez, VM
    [J]. THIN SOLID FILMS, 1999, 347 (1-2) : 195 - 200
  • [4] Low temperature photoformation of tantalum oxide
    Boyd, IW
    Zhang, JY
    [J]. MICROELECTRONICS RELIABILITY, 2000, 40 (4-5) : 649 - 655
  • [5] Imaging water dissociation on TiO2(110) -: art. no. 266103
    Brookes, IM
    Muryn, CA
    Thornton, G
    [J]. PHYSICAL REVIEW LETTERS, 2001, 87 (26) : 266103 - 1
  • [6] BURG KV, 1981, CHEM PHYS LETT, V78, P287
  • [7] Conduction and valence band positions of Ta2O5, TaON, and Ta3N5 by UPS and electrochemical methods
    Chun, WJ
    Ishikawa, A
    Fujisawa, H
    Takata, T
    Kondo, JN
    Hara, M
    Kawai, M
    Matsumoto, Y
    Domen, K
    [J]. JOURNAL OF PHYSICAL CHEMISTRY B, 2003, 107 (08) : 1798 - 1803
  • [8] A matrix isolation and ab initio study of the hydrogen peroxide dimer
    Engdahl, A
    Nelander, B
    Karlström, G
    [J]. JOURNAL OF PHYSICAL CHEMISTRY A, 2001, 105 (37) : 8393 - 8398
  • [9] The electronic structure of tantalum (oxy)nitrides TaON and Ta3N5
    Fang, CM
    Orhan, E
    de Wijs, GA
    Hintzen, HT
    de Groot, RA
    Marchand, R
    Saillard, JY
    de With, G
    [J]. JOURNAL OF MATERIALS CHEMISTRY, 2001, 11 (04) : 1248 - 1252
  • [10] Interface of tantalum oxide films on silicon by UV annealing at low temperature
    Fang, Q
    Zhang, JY
    Wang, ZM
    Wu, JX
    O'Sullivan, BJ
    Hurley, PK
    Leedham, TL
    Davies, H
    Audier, MA
    Jimenez, C
    Senateur, JP
    Boyd, IW
    [J]. THIN SOLID FILMS, 2003, 428 (1-2) : 248 - 252