Evolution of the Interfacial Structure of LaAlO3 on SrTiO3

被引：125

作者：

Pauli, S. A. ^{[1
]}

Leake, S. J. ^{[1
]}

Delley, B. ^{[1
]}

Bjoerck, M. ^{[1
]}

Schneider, C. W. ^{[1
]}

Schlepuetz, C. M. ^{[1
]}

Martoccia, D. ^{[1
]}

Paetel, S. ^{[2
]}

Mannhart, J. ^{[2
]}

Willmott, P. R. ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Univ Augsburg, Ctr Elect Correlat & Magnetism, Inst Phys, D-86135 Augsburg, Germany

来源：

PHYSICAL REVIEW LETTERS | 2011年 / 106卷 / 03期

关键词：

LAALO3/SRTIO3;

D O I：

10.1103/PhysRevLett.106.036101

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The evolution of the atomic structure of LaAlO3 grown on SrTiO3 was investigated using surface x-ray diffraction in conjunction with model-independent, phase-retrieval algorithms between two and five monolayers film thickness. A depolarizing buckling is observed between cation and oxygen positions in response to the electric field of polar LaAlO3, which decreases with increasing film thickness. We explain this in terms of competition between elastic strain energy, electrostatic energy, and electronic reconstructions. Based on these structures, the threshold for formation of a two-dimensional electron system at a film thickness of 4 monolayers is quantitatively explained. The findings are also qualitatively reproduced by density-functional-theory calculations.

引用

页数：4

共 18 条

[1] Atomic imaging of thin films with surface x-ray diffraction: introducing DCAF [J].