High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths

被引：30

作者：

Chiang, HP ^{[1
]}

Lin, JL

Chang, RL

Su, SY

Leung, PT

机构：

[1] Natl Taiwan Ocean Univ, Inst Optoelect Sci, Chilung, Taiwan

[2] Acad Sinica, Inst Phys, Taipei, Taiwan

[3] Portland State Univ, Dept Phys, Portland, OR 97207 USA

来源：

OPTICS LETTERS | 2005年 / 30卷 / 20期

关键词：

D O I：

10.1364/OL.30.002727

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9 X 10(-6) deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values. (c) 2005 Optical Society of America.

引用

页码：2727 / 2729

页数：3

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