Evidence of the negative-U behavior of H in GaAs from an investigation of H and As antisites

被引:11
作者
Bonapasta, AA [1 ]
机构
[1] ICMAT, Consiglio Nazl Ric, Via Salaria Km 29-500,CP-10, I-00016 Monterotondo, Italy
关键词
D O I
10.1103/PhysRevB.58.10378
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The ordering of the donor and acceptor levels induced by hydrogen in the band gap of GaAs is related to a positive- or negative-U behavior of H and is crucial in the interaction of H with deep defects. However, it is still an object of debate because of uncertain experimental results. In the present paper, it is shown that an analysis of the atomic arrangements and of the electronic-charge distributions fur a H atom in presence of a deep donor, the As antisite, provides clear evidence of an inverted order of the I-I-induced levels and allows to estimate their position in the band gap. [S0163-1829(98)09239-X].
引用
收藏
页码:10378 / 10382
页数:5
相关论文
共 23 条
[1]   THEORY OF THE SILICON VACANCY - AN ANDERSON NEGATIVE-U SYSTEM [J].
BARAFF, GA ;
KANE, EO ;
SCHLUTER, M .
PHYSICAL REVIEW B, 1980, 21 (12) :5662-5686
[2]  
Bonapasta AA, 1998, DEFECT DIFFUS FOR/JR, V159, P133
[3]   HYDROGEN PASSIVATION OF EL2 DEFECTS AND H-2-ASTERISK-LIKE COMPLEX-FORMATION IN GALLIUM-ARSENIDE [J].
BONAPASTA, AA .
PHYSICAL REVIEW B, 1995, 51 (07) :4172-4175
[4]   H MULTITRAPPING MECHANISMS AND H-2-MOLECULE FORMATION IN DOPED CRYSTALLINE SILICON [J].
BONAPASTA, AA .
PHYSICAL REVIEW B, 1992, 46 (16) :10119-10126
[5]   THEORY OF HYDROGEN-DECORATED GALLIUM VACANCIES IN GAAS AND OF THEIR RADIATIVE COMPLEXES [J].
BONAPASTA, AA ;
CAPIZZI, M .
PHYSICAL REVIEW B, 1995, 52 (15) :11044-11051
[6]   HYDROGEN PASSIVATION OF CARBON-DOPED GALLIUM-ARSENIDE [J].
BONAPASTA, AA .
PHYSICAL REVIEW B, 1993, 48 (12) :8771-8779
[7]   Interstitial hydrogen and enhanced dissociation of C-H complexes in GaAs [J].
Breuer, SJ ;
Jones, R ;
Briddon, PR ;
Oberg, S .
PHYSICAL REVIEW B, 1996, 53 (24) :16289-16296
[8]   GROUND-STATE OF THE ELECTRON-GAS BY A STOCHASTIC METHOD [J].
CEPERLEY, DM ;
ALDER, BJ .
PHYSICAL REVIEW LETTERS, 1980, 45 (07) :566-569
[9]   ELECTRONIC LEVEL OF INTERSTITIAL HYDROGEN IN GAAS [J].
CLERJAUD, B ;
GENDRON, F ;
KRAUSE, M ;
ULRICI, W .
PHYSICAL REVIEW LETTERS, 1990, 65 (14) :1800-1803
[10]   INVERTED ORDER OF ACCEPTOR AND DONOR LEVELS OF MONATOMIC HYDROGEN IN SILICON [J].
JOHNSON, NM ;
HERRING, C ;
VAN DE WALLE, CG .
PHYSICAL REVIEW LETTERS, 1994, 73 (01) :130-133