Interaction of ultrashort x-ray pulses with B4C, SiC, and Si

被引：19

作者：

Bergh, M. ^{[1
]}

Timneanu, N. ^{[1
]}

Hau-Riege, S. P. ^{[2
]}

Scott, H. A. ^{[2
]}

机构：

[1] Uppsala Univ, Lab Mol Biophys, SE-75124 Uppsala, Sweden

[2] Lawrence Livermore Natl Lab, Livermore, CA 94551 USA

来源：

PHYSICAL REVIEW E | 2008年 / 77卷 / 02期

关键词：

FREE-ELECTRON LASER; EXTREME-ULTRAVIOLET; RADIATION; IONIZATION; SIMULATION; DENSITIES; ABLATION; WATER; VUV;

D O I：

10.1103/PhysRevE.77.026404

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

The interaction of 32.5 and 6 nm ultrashort x-ray pulses with the solid materials B4C, SiC, and Si is simulated with a nonlocal thermodynamic equilibrium radiation transfer code. We study the ionization dynamics as a function of depth in the material and modifications of the opacity during irradiation, and estimate the crater depth. Furthermore, we compare the estimated crater depth with experimental data, for fluences up to 2.2 J/cm(2). Our results show that, at 32.5 nm irradiation, the opacity changes by less than a factor of 2 for B4C and Si and by a factor of 3 for SiC, for fluences up to 200 J/cm(2). At a laser wavelength of 6 nm, the model predicts a dramatic decrease in opacity due to the weak inverse bremsstrahlung, increasing the crater depth for high fluences.

引用

页数：8

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