Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids

被引：102

作者：

Chalupsky, J.

Juha, L.

Kuba, J.

Cihelka, J.

Hajkova, V.

Koptyaev, S.

Krasa, J.

Velyhan, A.

Bergh, M.

Caleman, C.

Hajdu, J.

Bionta, R. M.

Chapman, H.

Hau-Riege, S. P.

London, R. A.

Jurek, M.

Krzywinski, J.

Nietubyc, R.

Pelka, J. B.

Sobierajski, R.

Meyer-ter-Vehn, J.

Tronnier, A.

Sokolowski-Tinten, K.

Stojanovic, N.

Tiedtke, K.

Toleikis, S.

Tschentscher, T.

Wabnitz, H.

Zastrau, U.

机构：

[1] Acad Sci Czech Republ, Inst Phys, Prague 18221 8, Czech Republic

[2] Czech Tech Univ Prague, Prague 16636 1, Czech Republic

[3] Acad Sci Czech Republ, J Heyrovsky Inst Phys Chem, CR-18223 Prague 8, Czech Republic

[4] Charles Univ Prague, Prague 12843 2, Czech Republic

[5] Uppsala Univ, Ctr Biomed, SE-75124 Uppsala, Sweden

[6] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[7] Polish Acad Sci, Inst Phys, PL-02668 Warsaw, Poland

[8] Soltan Inst Nucl Studies, PL-05400 Otwock, Poland

[9] Max Planck Inst Quantum Opt, D-85748 Garching, Germany

[10] Univ Duisburg Essen, D-45117 Essen, Germany

[11] DESY, D-22603 Hamburg, Germany

[12] Univ Jena, D-07743 Jena, Germany

来源：

OPTICS EXPRESS | 2007年 / 15卷 / 10期

关键词：

D O I：

10.1364/OE.15.006036

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda< 100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly ( methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9 +/- 7.5) nm and similar to 2 mJ center dot cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mu m resolution by a method developed here. (C) 2007 Optical Society of America

引用

页码：6036 / 6043

页数：8

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