Swift heavy ion induced modification of C60 thin films

被引:61
作者
Bajwa, N
Dharamvir, K
Jindal, VK [1 ]
Ingale, A
Avasthi, DK
Kumar, R
Tripathi, A
机构
[1] Panjab Univ, Dept Phys, Chandigarh 160014, India
[2] Ctr Adv Technol, Laser Phys Div, Indore 452013, India
[3] Ctr Nucl Sci, New Delhi 110067, India
关键词
D O I
10.1063/1.1581381
中图分类号
O59 [应用物理学];
学科分类号
摘要
Modification of thin film samples of C-60 on Si and quartz substrates, induced by irradiation of 110 MeV Ni ions at various fluences, was studied. The pristine and irradiated samples were investigated using Raman spectroscopy, electrical conductivity, and optical absorption spectroscopy. The Raman data and band gap measurements indicate that swift ions at low fluences result in aggregate formations involving multiple molecular units such as dimers or polymers. High fluence irradiation results in submolecular formations and amorphous semiconducting carbon, indicating overall damage (fragmentation) of the fullerene molecules. These submolecular units in the amorphous carbon network have been identified as nanocrystalline graphite. (C) 2003 American Institute of Physics.
引用
收藏
页码:326 / 333
页数:8
相关论文
共 34 条
[1]   Effects and uses of ion beams with diamond, DLC and fullerene films [J].
Avasthi, DK .
VACUUM, 1996, 47 (11) :1249-1258
[2]  
BAJWA N, 2003, INT C AT COLL SOL 19
[3]   FOCUSED INELASTIC RESONANCES IN PARTICLE SCATTERING FROM SURFACES [J].
BENEDEK, G ;
MIRETARTES, S .
SURFACE SCIENCE, 1995, 339 (03) :L935-L939
[4]   In situ diffraction measurement of the polymerization of C60 at high temperatures and pressures [J].
Bennington, SM ;
Kitamura, N ;
Cain, MG ;
Lewis, MH ;
Wood, RA ;
Fukumi, AK ;
Funakoshi, K .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2000, 12 (28) :L451-L456
[5]   OBSERVATION OF HIGHER-ORDER RAMAN MODES IN C-60 FILMS [J].
DONG, ZH ;
ZHOU, P ;
HOLDEN, JM ;
EKLUND, PC ;
DRESSELHAUS, MS ;
DRESSELHAUS, G .
PHYSICAL REVIEW B, 1993, 48 (04) :2862-2865
[6]   Electron-phonon coupling and the sensitivity of metals to irradiation with swift heavy ions [J].
Dufour, C ;
Paumier, E ;
Toulemonde, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 122 (03) :445-448
[7]   Resonant Raman spectroscopy of disordered, amorphous, and diamondlike carbon [J].
Ferrari, AC ;
Robertson, J .
PHYSICAL REVIEW B, 2001, 64 (07)
[8]   The effect of fluence on the hardening of C60 films irradiated with He and N ions [J].
Foerster, CE ;
Serbena, FC ;
Lepienski, CM ;
Baptista, DL ;
Zawislak, FC .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1999, 148 (1-4) :634-638
[9]   Structural effect on electronic sputtering of hydrogenated amorphous carbon films [J].
Ghosh, S ;
Ingale, A ;
Som, T ;
Kabiraj, D ;
Tripathi, A ;
Mishra, S ;
Zhang, S ;
Hong, X ;
Avasthi, DK .
SOLID STATE COMMUNICATIONS, 2001, 120 (11) :445-450
[10]   AN EELS STUDY OF FULLERITE - C-60-/C-70 [J].
HANSEN, PL ;
FALLON, PJ ;
KRATSCHMER, W .
CHEMICAL PHYSICS LETTERS, 1991, 181 (04) :367-372