Electrochemical and structural properties of radio frequency sputtered cobalt oxide electrodes for thin-film supercapacitors

被引:142
作者
Kim, HK
Seong, TY
Lim, JH
Cho, WI
Yoon, YS
机构
[1] KIST, Thin Film Technol Res Ctr, Seoul 130650, South Korea
[2] KIST, Battery & Fuel Cell Ctr, Seoul 130650, South Korea
[3] K JIST, Dept Mat Sci & Engn, Kwangju 500712, South Korea
关键词
thin-film; supercapacitor; Co3O4; LiPON electrolyte; gas-ratio; capacitance;
D O I
10.1016/S0378-7753(01)00864-3
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The electrochemical and structural properties of cobalt oxide films which are deposited at different sputtering gas-ratios Of O-2/(Ar + O-2) are investigated. In order to examine the electrochemical properties of the as-deposited films, all solid-state thin-film. supercapacitors (TFSCs) are fabricated. There Consist Of Co3O4 electrodes and an amorphous LiPON thin-film electrolyte. It is shown that the capacitance behaviour of the Co3O4/LiPON/Co3O4 TFSCs is similar to bulk-type supercapacitor behaviour. It is further shown that the electrochemical behaviour of the TFSCs is dependent on the sputtering gas-ratios. The gas-ratio dependence of the capacitance of the oxide electrode films is discussed based on X-ray diffraction (XRD) and electrical results for the Co3O4 films. (C) 2001 Published by Elsevier Science B.V.
引用
收藏
页码:167 / 171
页数:5
相关论文
共 21 条
  • [1] ALCAZAR HBS, 1988, P 33 INT POW SOURC S, P607
  • [2] Conway B. E., 1999, ELECTROCHEMICAL SUPE, DOI DOI 10.1007/978-1-4757-3058-6
  • [3] 'In situ' and 'ex situ' characterization of the surface properties of the RuO2(x)+Co3O4(1-x) system
    Da Silva, LM
    Boodts, JFC
    DeFaria, LA
    [J]. ELECTROCHIMICA ACTA, 2000, 45 (17) : 2719 - 2727
  • [4] Jcon E. J., 2000, J KOREAN ELECTROCHEM, V3, P115
  • [5] JEON EJ, IN PRESS J ELECTROCH
  • [6] Formation process and electrical property of RuO2 thin films prepared by reactive sputtering
    Kaga, Y
    Abe, Y
    Yanagisawa, H
    Sasaki, K
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (6A): : 3457 - 3461
  • [7] KIM HK, 2000, J KOR I ELEC ELECT M, V13, P751
  • [8] KIM HK, 2001, J KOR CERAM SOC, V38, P100
  • [9] KIM HK, 2001, J KOR CERAM SOC, V38, P274
  • [10] KIM HK, 2001, KOR J MAT RES, V11