Porosity and mechanical properties of mesoporous thin films assessed by environmental ellipsometric porosimetry

被引：376

作者：

Boissiere, C

Grosso, D

Lepoutre, S

Nicole, L

Bruneau, AB

Sanchez, C

机构：

[1] Univ Paris 06, Lab Chim Mat Condensee, F-75252 Paris, France

[2] Univ Paris 06, CNRS, UMR 7601, Inst Nanosci Paris, F-75015 Paris, France

来源：

LANGMUIR | 2005年 / 21卷 / 26期

关键词：

D O I：

10.1021/la050981z

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Mesoordered silica thin films with cubic structures were prepared by evaporation induced self-assembly (EISA) with two types of structuring agent (CTAB and block copolymer F127). A complete and accurate description of these films was obtained by combining 2D-SAXS analyses, variable angle spectroscopic ellipsometry, and a specially designed environmental ellipsometric porosimetry (EEP) experiment. The EEP analysis is rapid and cheap and operates at ambient pressure and temperature. This latter experiment was performed with water and produced a set of water adsorption-desorption isotherms. A modified Kelvin equation, coupled with a modelisation of pores contraction, enabled the determination of the structural parameters of films porous networks: ellipsoidal pore diameters, porous volume, and surface area. Young moduli of films in the direction perpendicular to the substrates were calculated from these parameters.

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收藏

页码：12362 / 12371

页数：10

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