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High energy X-ray phase contrast microscopy using a circular Bragg-Fresnel lens

被引：30
作者：
Snigirev, A
Snigireva, I
Bosecke, P
Lequien, S
Schelokov, I
机构：
[1] RAS,INST MICROELECT TECHNOL,CHERNOGOLOVKA 142432,RUSSIA
[2] CNRS,CRISTALLOG LAB,F-38042 GRENOBLE,FRANCE
来源：
OPTICS COMMUNICATIONS | 1997年 / 135卷 / 4-6期
关键词：
X-ray optics; focusing; microscopy; imaging;
D O I：
10.1016/S0030-4018(96)00648-7
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
High energy X-ray phase contrast microscopy based on Bragg-Fresnel optics with submicrometer resolution was demonstrated. An X-ray image of a free-standing gold grid was observed at 9.5 keV using a circular Bragg-Fresnel lens in backscattering geometry. The fine 0.5 mu m gold grid was clearly seen not only in the open areas of the supporting mesh but also underneath the 3 mu m bars. A contrast of more than 20% was measured. The theory of the image formation in partially coherent X-rays on a basis of Hopkins formula is considered. The application of phase contrast imaging for low-density materials is discussed.
引用
收藏
页码：378 / 384
页数：7
相关论文
共 19 条
[1]  
ARISTOVA E, 1994, XRAY MICROSCOPY IY, P617
[2]   2-DIMENSIONAL FOCUSING OF HARD X-RAYS BY A PHASE CIRCULAR BRAGG-FRESNEL LENS IN THE CASE OF BRAGG BACKSCATTERING [J].
BASOV, YA ;
PRAVDIVTSEVA, TL ;
SNIGIREV, AA ;
BELAKHOVSKY, M ;
DHEZ, P ;
FREUND, A .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1991, 308 (1-2) :363-366
[3]   HIGH-BRILLIANCE BEAMLINE AT THE EUROPEAN SYNCHROTRON-RADIATION FACILITY [J].
BOSECKE, P ;
DIAT, O ;
RASMUSSEN, B .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) :1636-1638
[4]   EMITTANCE MONITORS BASED ON BRAGG-FRESNEL LENSES [J].
HARTMAN, Y ;
TARAZONA, E ;
ELLEAUME, P ;
SNIGIREVA, I ;
SNIGIREV, A .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (02) :1978-1980
[5]   ON THE DIFFRACTION THEORY OF OPTICAL IMAGES [J].
HOPKINS, HH .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1953, 217 (1130) :408-432
[6]  
HOWELLS MR, 1994, XRAY MICROSCOPY IY, P414
[7]   X-RAY HOLOGRAPHIC MICROSCOPY USING PHOTORESISTS [J].
JACOBSEN, C ;
HOWELLS, M ;
KIRZ, J ;
ROTHMAN, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1990, 7 (10) :1847-1861
[8]   SUBMICROMETER FLUORESCENCE MICROPROBE BASED ON BRAGG-FRESNEL OPTICS [J].
KUZNETSOV, SM ;
SNIGIREVA, II ;
SNIGIREV, AA ;
ENGSTROM, P ;
RIEKEL, C .
APPLIED PHYSICS LETTERS, 1994, 65 (07) :827-829
[9]  
MICHETTE AG, 1993, XRAY SCI TECHNOLOGY, P340
[10]   Phase-contrast microtomography with coherent high-energy synchrotron x rays [J].
Raven, C ;
Snigirev, A ;
Snigireva, I ;
Spanne, P ;
Souvorov, A ;
Kohn, V .
APPLIED PHYSICS LETTERS, 1996, 69 (13) :1826-1828
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