Antireflection subwavelength structure of silicon surface formed by wet process using catalysis of single nano-sized gold particle
被引:74
作者:
论文数: 引用数:
h-index:
机构:
Nishioka, Kensuke
[1
,2
]
Horita, Susumu
论文数: 0引用数: 0
h-index: 0
机构:
Japan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, JapanJapan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
Horita, Susumu
[1
]
Ohdaira, Keisuke
论文数: 0引用数: 0
h-index: 0
机构:
Japan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, JapanJapan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
Ohdaira, Keisuke
[1
]
Matsumura, Hideki
论文数: 0引用数: 0
h-index: 0
机构:
Japan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, JapanJapan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
Matsumura, Hideki
[1
]
机构:
[1] Japan Adv Inst Sci & Technol, Grad Sch Mat Sci, Nomi, Ishikawa 9231292, Japan
[2] Miyazaki Univ, Fac Engn, Miyazaki 8891292, Japan
silicon;
gold;
single nano-sized particle;
catalysis;
subwavelength structure;
antireflection;
D O I:
10.1016/j.solmat.2008.02.017
中图分类号:
TE [石油、天然气工业];
TK [能源与动力工程];
学科分类号:
0807 ;
0820 ;
摘要:
Subwavelength structure (SWS) was formed by simple wet chemical etching using catalysis of gold (Au) nanoparticle. Single, nano-sized Au particle dispersion solution was coated onto silicon (Si)(111) substrate with polished surface. Then, the samples were soaked in an aqueous etching solution of h drofluoric acid and hydrogen peroxide The surface of 15-min-etched Si substrate appeared black. The reflectivity of the Si substrate was reduced to below 5% throughout the entire spectrum from 300 to 800 nm owing to SWS. The fractional area occupied by Si as a function of the depth across the textured layer showed a smooth increase of density up to a depth. The observed optical effects were explained by the formation of a subwavelength scale taper structure, representing an effective medium with a smooth transition of the refractive index from air to Si. (c) 2008 Elsevier B.V. All rights reserved.