An efficient autofocus algorithm for a visible microscope on a Mars lander

被引:16
作者
Luethi, B. S. [1 ]
Thomas, N. [1 ]
Hviid, S. F. [2 ]
Rueffer, P. [3 ]
机构
[1] Univ Bern, Inst Phys, CH-3012 Bern, Switzerland
[2] Max Planck Inst Sonnensyst Forsch, D-37191 Katlenburg Lindau, Germany
[3] TU Braunschweig, Inst Datentech & Kommunikat Netze, D-38106 Braunschweig, Germany
基金
瑞士国家科学基金会;
关键词
Extended depth of focus; Bright field microscopy; Mars; Lander; Image processing;
D O I
10.1016/j.pss.2010.05.002
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
The limited depth of focus of microscope optics precludes the observation of a three-dimensional surface in a single view. For an efficient operation of a planetary microscope observing a highly irregular surface, an autofocus algorithm must detect partially focused views and merge them into a completely focused image (extended depth of focus). In this paper we investigate the suitability of different algorithms for autonomous image focusing onboard a Mars lander. We show that all methods under study, except for the Variance method, produce reasonable results and that their performance depends (amongst other factors) on sample morphology. For reasons of simplicity and reduced computational requirements we favor Gradient and Roberts methods and present an efficient implementation thereof. (C) 2010 Elsevier Ltd. All rights reserved.
引用
收藏
页码:1258 / 1264
页数:7
相关论文
共 10 条
[1]  
ALLEN CC, 1997, LUN PLAN I C, V28
[2]  
[Anonymous], ESA B
[3]  
BIBRING JP, 2008, LPI CONTRIBUTIONS, V1441
[4]   Microscopy capabilities of the Microscopy, Electrochemistry, and Conductivity Analyzer [J].
Hecht, M. H. ;
Marshall, J. ;
Pike, W. T. ;
Staufer, U. ;
Blaney, D. ;
Braendlin, D. ;
Gautsch, S. ;
Goetz, W. ;
Hidber, H. -R. ;
Keller, H. U. ;
Markiewicz, W. J. ;
Mazer, A. ;
Meloy, T. P. ;
Morookian, J. M. ;
Mogensen, C. ;
Parrat, D. ;
Smith, P. ;
Sykulska, H. ;
Tanner, R. J. ;
Reynolds, R. O. ;
Tonin, A. ;
Vijendran, S. ;
Weilert, M. ;
Woida, P. M. .
JOURNAL OF GEOPHYSICAL RESEARCH-PLANETS, 2008, 113
[5]  
Herkenhoff K. E., 2003, J GEOPHYS RES PLANET, V108
[6]   MULTISENSOR IMAGE FUSION USING THE WAVELET TRANSFORM [J].
LI, H ;
MANJUNATH, BS ;
MITRA, SK .
GRAPHICAL MODELS AND IMAGE PROCESSING, 1995, 57 (03) :235-245
[7]   The microscope for Beagle 2 [J].
Thomas, N ;
Lüthi, BS ;
Hviid, SF ;
Keller, HU ;
Markiewcz, WJ ;
Blümchen, T ;
Basilevsky, AT ;
Smith, PH ;
Tanner, R ;
Oquest, C ;
Reynolds, R ;
Josset, JL ;
Beauvivre, S ;
Hofmann, B ;
Rüffer, P ;
Pillinger, CT .
PLANETARY AND SPACE SCIENCE, 2004, 52 (09) :853-866
[8]  
Valdecasas A.G., 2002, EUROPEAN MICROSCOPY, V79, P15
[9]   On the extended depth of focus algorithms for bright field microscopy [J].
Valdecasas, AG ;
Marshall, D ;
Becerra, JM ;
Terrero, JJ .
MICRON, 2001, 32 (06) :559-569
[10]   AUTOFOCUSING FOR TISSUE MICROSCOPY [J].
YEO, TTE ;
ONG, SH ;
JAYASOORIAH ;
SINNIAH, R .
IMAGE AND VISION COMPUTING, 1993, 11 (10) :629-639