Sharpened carbon nanotube probes

被引：11

作者：

Moloni, K ^{[1
]}

Lal, A ^{[1
]}

Lagally, M ^{[1
]}

机构：

[1] Piezomax Technol Inc, Madison, WI 53719 USA

来源：

OPTICAL DEVICES AND DIAGNOSTICS IN MATERIALS SCIENCE | 2000年 / 4098卷

关键词：

D O I：

10.1117/12.401613

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Carbon nanotube tips (CNT) offer many advantages over the standard SFM probes, namely high aspect ratio, high resolution, durability, minimal tip or sample damage and, perhaps most important, tailoring. We demonstrate here the value of CNT as probes for surface metrology. Their high-aspect ratio enables profiling morphologies that are inaccessible to conventional probes. We report method for controlling the end-form of a nanotube bundle (mounted on a Si tip) so that a single nanotube protrudes from it. We did not observe any tip or sample wear over time with CNT probes, contrary to results with conventional probes. We also demonstrate that a combination of tuning forks and nanotubes can be used as probes for SPM.

引用

页码：76 / 83

页数：8

共 10 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].