Development of a scanning atom probe and atom-by-atom mass analysis of diamonds

被引:20
作者
Nishikawa, O
Sekine, T
Ohtani, Y
Maeda, K
Numada, Y
Watanabe, M
Iwatsuki, M
Aoki, S
Itoh, J
Yamanaka, K
机构
[1] Kanazawa Inst Technol, Dept Mat Sci & Engn, Kanazawa S 9218501, Japan
[2] Jeol Ltd, Electron Opt Div, Dept Res & Dev, Tokyo 1960021, Japan
[3] Electrotech Lab, Tsukuba, Ibaraki 3050045, Japan
[4] Tohoku Univ, Grad Sch Engn, Dept Mat Proc, Aoba Ku, Sendai, Miyagi 9800845, Japan
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1998年 / 66卷 / Suppl 1期
关键词
D O I
10.1007/s003390051090
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A scanning atom probe (SAP) was constructed by modifying an ultrahigh vacuum scanning tunneling microscope. A unique feature of the SAP is the introduction of a funnel-shaped microextraction electrode to a conventional atom probe. The electrode scans over an unsmoothed specimen surface at a negative bias voltage and stands still right above an apex of a microcusp. Then the high electric field required for field evaporation of the apex atoms is confined in an extremely small space between the small open hole of the funnel-shaped electrode and the apex of the microcusp. The Pt and Si extraction electrodes are fabricated by mechanical and lithographic processes, respectively, and the diameter of the open hole at the sharp end of the electrode is in the range of 2 to 50 mu m and its height is 0.1 to 0.3 mm. In order to examine the unique capability of the SAP, diamond grown by chemical vapor deposition (CVD) and fabricated by high-pressure high-temperature (HPHT) processes was mass analyzed atom-by-atom. The study has revealed that the diamond contains an unexpectedly large amount of hydrogen and that the clusters of 5, 8, and 16 carbon atoms in the diamond structure are weakly bound by hydrogen bonds.
引用
收藏
页码:S11 / S16
页数:6
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