Noise thermometry and electron thermometry of a sample-on-cantilever system below 1 Kelvin

被引：15

作者：

Bleszynski-Jayich, A. C. ^{[1
]}

Shanks, W. E. ^{[1
]}

Harrisa, J. G. E. ^{[2
]}

机构：

[1] Yale Univ, Dept Phys, New Haven, CT 06520 USA

[2] Yale Univ, Dept Phys & Appl Phys, New Haven, CT 06520 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 92卷 / 01期

关键词：

D O I：

10.1063/1.2821828

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have used two types of thermometry to study thermal fluctuations in a microcantilever-based system below 1 K. We measured the temperature of a cantilever's macroscopic degree of freedom (via the Brownian motion of its lowest flexural mode) and its microscopic degrees of freedom (via the electron temperature of a metal sample mounted on the cantilever). We also measured both temperatures' response to a localized heat source. We find that it is possible to maintain thermal equilibrium between these two temperatures and a refrigerator down to at least 300 mK. These results are promising for ongoing experiments to probe quantum effects using micromechanical devices. (c) 2008 American Institute of Physics.

引用

页数：3

共 28 条

[1] Radiation-pressure cooling and optomechanical instability of a micromirror [J].