Noise thermometry and electron thermometry of a sample-on-cantilever system below 1 Kelvin

被引:15
作者
Bleszynski-Jayich, A. C. [1 ]
Shanks, W. E. [1 ]
Harrisa, J. G. E. [2 ]
机构
[1] Yale Univ, Dept Phys, New Haven, CT 06520 USA
[2] Yale Univ, Dept Phys & Appl Phys, New Haven, CT 06520 USA
关键词
D O I
10.1063/1.2821828
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have used two types of thermometry to study thermal fluctuations in a microcantilever-based system below 1 K. We measured the temperature of a cantilever's macroscopic degree of freedom (via the Brownian motion of its lowest flexural mode) and its microscopic degrees of freedom (via the electron temperature of a metal sample mounted on the cantilever). We also measured both temperatures' response to a localized heat source. We find that it is possible to maintain thermal equilibrium between these two temperatures and a refrigerator down to at least 300 mK. These results are promising for ongoing experiments to probe quantum effects using micromechanical devices. (c) 2008 American Institute of Physics.
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页数:3
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