A universal gauge for thermal conductivity of silicon nanowires with different cross sectional geometries

被引:48
作者
Chen, Jie [1 ,2 ]
Zhang, Gang [3 ,4 ]
Li, Baowen [1 ,2 ,5 ]
机构
[1] Natl Univ Singapore, Dept Phys, Singapore 117542, Singapore
[2] Natl Univ Singapore, Ctr Computat Sci & Engn, Singapore 117542, Singapore
[3] Peking Univ, Key Lab Phys & Chem Nanodevices, Beijing 100871, Peoples R China
[4] Peking Univ, Dept Elect, Beijing 100871, Peoples R China
[5] NUS Grad Sch Integrat Sci & Engn, Singapore 117456, Singapore
关键词
SEMICONDUCTOR NANOWIRES; SIMULATION; PERFORMANCE; REDUCTION; MODEL;
D O I
10.1063/1.3663386
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
By using molecular dynamics simulations, we study thermal conductivity of silicon nanowires (SiNWs) with different cross sectional geometries. It is found that thermal conductivity decreases monotonically with the increase of surface-to-volume ratio (SVR). More interestingly, a simple universal linear dependence of thermal conductivity on SVR is observed for SiNWs with modest cross sectional area (larger than 20 nm(2)), regardless of the cross sectional geometry. As a result, among different shaped SiNWs with the same cross sectional area, the one with triangular cross section has the lowest thermal conductivity. Our study provides not only a universal gauge for thermal conductivity among different cross sectional geometries, but also a designing guidance to tune thermal conductivity by geometry. (C) 2011 American Institute of Physics. [doi:10.1063/1.3663386]
引用
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页数:7
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