Photoemission microscopy from magnetically coupled thin-film systems

被引：7

作者：

Schneider, CM ^{[1
]}

de Haas, O

Muschiol, U

Cramer, N

Oelsner, A

Klais, M

Schmidt, O

Fecher, GH

Jark, W

Schönhense, G

机构：

[1] Inst Solid State & Mat Res Dresden, Dresden, Germany

[2] Univ Colorado, Dept Engn, Colorado Springs, CO 80907 USA

[3] Univ Mainz, Inst Phys, D-6500 Mainz, Germany

[4] ELETTRA, Trieste, Italy

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2001年 / 233卷 / 1-2期

关键词：

photoemission; microscopy; interlayer coupling; exchange biasing;

D O I：

10.1016/S0304-8853(01)00219-0

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The magnetic microstructure and magnetic coupling phenomena in thin-film systems, relevant for applications in magneto-electronics, are investigated by means of photoemission electron microscopy. Element-selective magnetic information is obtained by exploiting magnetic circular dichroism in the soft X-ray regime. The domain shape and sizes found at the surface of anti ferromagnetically coupled metallic multilayers indicate the presence of a ferromagnetic coupling contribution, presumably caused by a build-up of roughness during the growth process, The magnetic domain patterns in FeNi microstructures on sputtered NiO films reflect the presence of a local exchange anisotropy, causing the phenomenon of exchange biasing or pinning of the ferromagnetic layer. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：14 / 20

页数：7

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