Nano-optical image and probe in a scanning near-field optical microscope

被引：5

作者：

Hosaka, S ^{[1
]}

Shintani, T ^{[1
]}

Kikukawa, A ^{[1
]}

Itoh, K ^{[1
]}

机构：

[1] Hitachi Ltd, Adv Res Lab, Kokubunji, Tokyo 185, Japan

来源：

APPLIED SURFACE SCIENCE | 1999年 / 140卷 / 3-4期

关键词：

SNOM; NSOM; nanometer size; near-field; MTF; non-contact; SPM;

D O I：

10.1016/S0169-4332(98)00560-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We study a nanometer-sized optical probe and image in a scanning near-field optical microscope (SNOM). We demonstrated the potential to observe 5-nn wide optical patterns using the SNOM. The probe profile was measured by using a knife-edge method and a modulated transfer function evaluation method. An aluminum covered and pipet-pulled fiber probe used hen has two optical probes, one which has a large diameter of 350 nm and one which has a small diameter of around 10 nm. (C) 1999 Elsevier Science B.V. All rights reserved.

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收藏

页码：388 / 393

页数：6

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