机构:Department of Physics, Faculty of Science, Hiroshima University
Ikeda, S
Maeno, Y
论文数: 0引用数: 0
h-index: 0
机构:Department of Physics, Faculty of Science, Hiroshima University
Maeno, Y
Nohara, M
论文数: 0引用数: 0
h-index: 0
机构:Department of Physics, Faculty of Science, Hiroshima University
Nohara, M
Fujita, T
论文数: 0引用数: 0
h-index: 0
机构:Department of Physics, Faculty of Science, Hiroshima University
Fujita, T
机构:
[1] Department of Physics, Faculty of Science, Hiroshima University
来源:
PHYSICA C
|
1996年
/
263卷
/
1-4期
关键词:
D O I:
10.1016/0921-4534(95)00718-0
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
We have synthesized a new phase of layered perovskite Sr2CaRu2Oy related to Sr3Ru2O7. The Ca-substitution weakens the antiferromagnetic correlations and reduces the magnetic transition temperature from 15 to 3 K. The antiferromagnetic correlation between Ru4+ spins in Sr2CaRu2Oy can be varied by adjusting the oxygen content y.
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
CAVA, RJ
;
ZANDBERGEN, HW
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
ZANDBERGEN, HW
;
KRAJEWSKI, JJ
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
KRAJEWSKI, JJ
;
PECK, WF
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
PECK, WF
;
BATLOGG, B
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
BATLOGG, B
;
CARTER, S
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
CARTER, S
;
FLEMING, RM
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
FLEMING, RM
;
ZHOU, O
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
ZHOU, O
;
RUPP, LW
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
CAVA, RJ
;
ZANDBERGEN, HW
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
ZANDBERGEN, HW
;
KRAJEWSKI, JJ
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
KRAJEWSKI, JJ
;
PECK, WF
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
PECK, WF
;
BATLOGG, B
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
BATLOGG, B
;
CARTER, S
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
CARTER, S
;
FLEMING, RM
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
FLEMING, RM
;
ZHOU, O
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS
ZHOU, O
;
RUPP, LW
论文数: 0引用数: 0
h-index: 0
机构:
TECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDSTECH UNIV DELFT,NATL CTR HIGH RESOLUT ELECTRON MICROSCOPY,DELFT,NETHERLANDS