X-ray CCD calibration for the AXAF CCD imaging spectrometer

被引：92

作者：

Bautz, M ^{[1
]}

Pivovaroff, M ^{[1
]}

Baganoff, F ^{[1
]}

Isobe, T ^{[1
]}

Jones, S ^{[1
]}

Kissel, S ^{[1
]}

LaMarr, B ^{[1
]}

Manning, H ^{[1
]}

Prigozhin, G ^{[1
]}

Ricker, G ^{[1
]}

Nousek, J ^{[1
]}

Grant, C ^{[1
]}

Nishikida, K ^{[1
]}

Scholze, F ^{[1
]}

Thornagel, R ^{[1
]}

Ulm, G ^{[1
]}

机构：

[1] MIT, Ctr Space Res, Cambridge, MA 02139 USA

来源：

X-RAY OPTICS, INSTRUMENTS, AND MISSIONS | 1998年 / 3444卷

关键词：

X-rays; charge coupled devices (CCD); calibration; AXAF; ACIS;

D O I：

10.1117/12.331238

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

Acquisition of ground calibration data from the AXAF CCD Imaging Spectrometer, one of two focal plane instruments on NASA's Advanced X-ray Astrophysics Facility, was completed in 1997. Here we summarize results of the detector level calibration effort. Our calibration program has included measurements of CCD response to undispersed synchroton radiation, measurements of X-ray Absorption Fine Structure, and of sub-pixel structure in the detector. Errors in the energy scale are at the level of a few tenths of one percent, and detection efficiency errors are no larger than a few percent. We have also obtained new insights into the mechanisms by which the CCD gate structure and channel stops influence the CCD spectral redistribution function.

引用

页码：210 / 224

页数：15

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