Contact resistance of carbon nanotubes

被引：159

作者：

Tersoff, J ^{[1
]}

机构：

[1] IBM Corp, Div Res, TJ Watson Res Ctr, Yorktown Heights, NY 10598 USA

来源：

APPLIED PHYSICS LETTERS | 1999年 / 74卷 / 15期

关键词：

D O I：

10.1063/1.123776

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Electrical contacts to carbon nanotubes typically exhibit high resistance, posing a serious obstacle to their application in electronic devices. One important factor may be their unique electronic structure, which gives weak electronic coupling at the Fermi surface. This suggests some possible ways to reduce contact resistance. (C) 1999 American Institute of Physics. [S0003-6951(99)00715-9].

引用

页码：2122 / 2124

页数：3

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