TiN/AIN bilayers and multilayers grown by magnetron co-sputtering

被引:12
作者
Auger, MA
Sanchez, O
Ballesteros, C
Jergel, M
Aguilar-Frutis, M
Falcony, C
机构
[1] CSIC, Inst Ciencia Mat Madrid, Madrid, Spain
[2] Univ Carlos III Madrid, Dept Fis, Madrid, Spain
[3] IPN, CINVESTAV, Dept Fis, Mexico City, DF, Mexico
[4] Slovak Acad Sci, Inst Phys, Bratislava, Slovakia
[5] IPN, CICATA, Mexico City 11500, DF, Mexico
关键词
reactive sputtering; titanium nitride; aluminium nitride; multilayers;
D O I
10.1016/S0040-6090(03)00321-3
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
TiN/AlN bilayers and multilayers were deposited on (100) silicon substrates using reactive magnetron sputtering technique. These combined coatings are known to possess high hardness and wear resistance, hence, their structural and mechanical properties were investigated. X-Ray diffraction, transmission electron microscopy, atomic force microscopy, spectroscopic ellipsometry and nanoindenter measurements were applied to characterise the films. The bilayer hardness increases with the individual layer thickness ratio approaching unity and further enhancement was obtained in the multilayers. The enhanced hardness seems to be related to a dislocation blocking effect at the interfaces which is promoted by the hexagonal (002) and cubic (I 11) textures found in AlN and TiN layers, respectively. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:211 / 216
页数:6
相关论文
共 17 条
  • [1] Influence of sputtering target material on crystallinity and orientation of AlN thin films
    Akiyama, M
    Xu, CN
    Hagio, T
    Nonaka, K
    [J]. JOURNAL OF THE CERAMIC SOCIETY OF JAPAN, 2002, 110 (02) : 115 - 117
  • [2] HALL-PETCH RELATIONS FOR MULTILAYERED MATERIALS
    ANDERSON, PM
    LI, C
    [J]. NANOSTRUCTURED MATERIALS, 1995, 5 (03): : 349 - 362
  • [3] Deposition of TiN/Al bilayers on a rotating substrate by reactive sputtering
    Auger, MA
    Gago, R
    Fernández, M
    Sánchez, O
    Albella, JM
    [J]. SURFACE & COATINGS TECHNOLOGY, 2002, 157 (01) : 26 - 33
  • [4] NANOINDENTATION STUDY OF THE MECHANICAL-PROPERTIES OF COPPER-NICKEL MULTILAYERED THIN-FILMS
    CAMMARATA, RC
    SCHLESINGER, TE
    KIM, C
    QADRI, SB
    EDELSTEIN, AS
    [J]. APPLIED PHYSICS LETTERS, 1990, 56 (19) : 1862 - 1864
  • [5] CAMMARATTA RC, 1990, APPL PHYS LETT, V57, P2654
  • [6] MODEL OF SUPERLATTICE YIELD STRESS AND HARDNESS ENHANCEMENTS
    CHU, X
    BARNETT, SA
    [J]. JOURNAL OF APPLIED PHYSICS, 1995, 77 (09) : 4403 - 4411
  • [7] Structural and electroacoustic studies of AIN thin films during low temperature radio frequency sputter deposition
    Engelmark, F
    Iriarte, GF
    Katardjiev, IV
    Ottosson, M
    Muralt, P
    Berg, S
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2001, 19 (05): : 2664 - 2669
  • [8] DEVELOPMENT OF PREFERRED ORIENTATION IN POLYCRYSTALLINE TIN LAYERS GROWN BY ULTRAHIGH-VACUUM REACTIVE MAGNETRON SPUTTERING
    GREENE, JE
    SUNDGREN, JE
    HULTMAN, L
    PETROV, I
    BERGSTROM, DB
    [J]. APPLIED PHYSICS LETTERS, 1995, 67 (20) : 2928 - 2930
  • [9] MATERIAL SELECTION FOR HARD COATINGS
    HOLLECK, H
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (06): : 2661 - 2669
  • [10] HIGH-FLUX LOW-ENERGY (SIMILAR-OR-EQUAL-TO-20 EV) N-2(+) ION IRRADIATION DURING TIN DEPOSITION BY REACTIVE MAGNETRON SPUTTERING - EFFECTS ON MICROSTRUCTURE AND PREFERRED ORIENTATION
    HULTMAN, L
    SUNDGREN, JE
    GREENE, JE
    BERGSTROM, DB
    PETROV, I
    [J]. JOURNAL OF APPLIED PHYSICS, 1995, 78 (09) : 5395 - 5403