Contact electrification studies using atomic force microscope techniques

被引:34
作者
Gady, B [1 ]
Reifenberger, R
Rimai, DS
机构
[1] Purdue Univ, Dept Phys, W Lafayette, IN 47907 USA
[2] Eastman Kodak Co, Off Imaging Res & Technol Dev, Rochester, NY USA
关键词
D O I
10.1063/1.368078
中图分类号
O59 [应用物理学];
学科分类号
摘要
Contact electrification measurements using atomic force microscopy techniques were performed using micrometer-sized spheres made of polystyrene and flat substrates of either freshly cleaved, highly oriented pyrolytic graphite (HOPG) or a 0.2-mu m-thick Au[lll] film grown on mica. The polystyrene/HQPG interaction exhibited significant electrostatic charging when compared to the polystyrene/Au system. This result is consistent with qualitative expectations of contact charging based on a triboelectric series of common materials. The observed contact electrification is also consistent: with electronic charge transfer between materials, rather than an ionic dr material transfer mechanism. (C) 1998 American Institute of Physics.
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页码:319 / 322
页数:4
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