High-resolution hard X-ray photoelectron spectroscopy: Application of valence band and core-level spectroscopy to materials science

被引：80

作者：

Kobayashi, K ^{[1
]}

机构：

[1] JASRI, Mikazuki, Hyogo 6795198, Japan

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2005年 / 547卷 / 01期

关键词：

D O I：

10.1016/j.nima.2005.05.016

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Hard X-ray photoelectron spectroscopy using high-flux X-rays from the third-generation synchrotron radiation sources has shown to be a valuable technique for the study of the bulk electronic and chemical states of materials. This paper gives an overview of the feasibility tests and the development of new applications of this technology carried out through collaboration between research institutes, SPring-8/JASRI, SPring-8/RIKEN, and HiSOR since the beginning of measurements at BL29XU of SPring-8. An energy range from 6 to 10 keV was tested, demonstrating high resolution and sufficient throughput for practical use. The results clearly demonstrate the wide applicability of this new method to many areas of materials science and technology. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：98 / 112

页数：15

共 40 条

[1]

DAIMON H, COMMUNICATION

[2] Looking 100 A deep into spatially inhomogeneous dilute systems with hard x-ray photoemission [J].