Angle measurement using total-internal-reflection heterodyne interferometry

被引:52
作者
Chiu, MH
Su, DC
机构
[1] National Chiao Tung University, Inst. of Electro-Optical Engineering, Hsin-Chu, 1001, Ta-Hsueh Road
[2] Inst. of Electro-Optical Engineering, National Chiao Tung University
[3] Inst. of Electro-Optical Engineering, National Chiao Tung University
关键词
angle measurement; total-internal-reflection effect; heterodyne interferometry;
D O I
10.1117/1.601200
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new optical method for angle measurement based on total-internal-reflection heterodyne interferometry is presented. In this method, heterodyne interferometry is applied to measure the phase difference between s and p polarization states at total internal reflection. This phase difference depends on the angle of incidence. Hence, small-angle measurement can be performed only by evaluating this phase difference. The validity of the method is demonstrated, and it has a measurement range of 10 deg. Its resolution depends on the angle of incidence; the best resolution is 8x10(-5) deg. (C) 1997 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:1750 / 1753
页数:4
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