Mode quality factor based on far-field emission for square resonators

被引：26

作者：

Guo, WH ^{[1
]}

Huang, YZ ^{[1
]}

Lu, QY ^{[1
]}

Yu, L ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optoelect, Beijing 100083, Peoples R China

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2004年 / 16卷 / 02期

基金：

中国国家自然科学基金;

关键词：

microcavities; mode quality factors; semiconductor lasers; square resonators;

D O I：

10.1109/LPT.2003.822243

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The quality factors of modes in square resonators are calculated based on the far-field emission of the analytical field distribution. The obtained quality factors are in reasonable agreement with those calculated by the finite-difference time-domain (FDTD) technique and Pade approximation method. The emission power in the square diagonal directions for whispering-gallery-like modes in square resonators is zero due to the interference cancellation caused by the odd field distributions relative to the diagonal mirror planes, so they have larger quality factors than the modes with even field distribution.

引用

页码：479 / 481

页数：3

共 9 条

[1] Hexagonal microlasers based on organic dyes in nanoporous crystals [J].