共 20 条
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APPLICATION OF REFLECTANCE DIFFERENCE SPECTROSCOPY TO MOLECULAR-BEAM EPITAXY GROWTH OF GAAS AND ALAS
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JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1988, 6 (03)
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[2]
ABOVE-BANDGAP OPTICAL ANISOTROPIES IN CUBIC SEMICONDUCTORS - A VISIBLE NEAR ULTRAVIOLET PROBE OF SURFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1985, 3 (05)
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[4]
STEPS ON SI(001)
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1989, 7 (03)
:1914-1918
[5]
SCANNING TUNNELING MICROSCOPY SCANNING TUNNELING SPECTROSCOPY OBSERVATION OF STEP STRUCTURES OF SI-(001) AND SI-(111) SURFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1991, 9 (02)
:711-715
[6]
JALOVIAR SG, IN PRESS
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SI(100) SURFACE UNDER AN EXTERNALLY APPLIED STRESS
[J].
PHYSICAL REVIEW LETTERS,
1988, 61 (21)
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