Reflectance difference spectroscopy: Experiment and theory for the model system Si(001):As and application to Si(001)

被引:110
作者
Kipp, L [1 ]
Biegelsen, DK [1 ]
Northrup, JE [1 ]
Swartz, LE [1 ]
Bringans, RD [1 ]
机构
[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304
关键词
D O I
10.1103/PhysRevLett.76.2810
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Reflectance difference spectroscopy (RDS), scanning tunneling microscopy, and calculations of the RDS spectra have been performed for the bare Si(001) surface and Si(001):As, thereby relating identified structures with RDS features. For the As-terminated surface, which exhibits a 2 X 1 symmetric As-As dimer structure, we demonstrate excellent agreement between measured and calculated spectra. For clean Si(001), which shows a more complex structure arising from dimer asymmetry, we provide identification of RDS spectral features arising from transitions between dangling-bond surface states.
引用
收藏
页码:2810 / 2813
页数:4
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