electromagnetic transients simulations;
fault location;
frequency dependent line model;
mutual coupled lines;
series compensation;
teed circuits;
wavelet transform;
D O I:
10.1109/TPWRD.2004.834303
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper describes a fault location algorithm for three terminal lines using wavelet transform of the fault initiated transients. The results presented in [1] are extended to the case of three terminal configuration and a new single ended procedure is developed for teed circuits. The algorithm gives accurate results for the case of three terminal lines including series compensated branch, mutual coupled line section and different values of fault resistances. The performance of the algorithm is tested on different scenarios by using ATP/EMTP program and MATLAB Wavelet Toolbox.