Large reduction of leakage current by graded-layer La doping in (Ba0.5, Sr0.5)TiO3 thin films

被引:41
作者
Saha, S [1 ]
Krupanidhi, SB [1 ]
机构
[1] Indian Inst Sci, Mat Res Ctr, Bangalore 560012, Karnataka, India
关键词
D O I
10.1063/1.1371791
中图分类号
O59 [应用物理学];
学科分类号
摘要
A large reduction in the leakage current behavior in (Ba, Sr)TiO3 (BST) thin films was observed by graded-layer donor doping. The graded doping was achieved by introducing La-doped BST layers in the grown BST films. The films showed a large decrease (about six orders of magnitude) in the leakage current in comparison to undoped films at an electric field of 100 kV/cm. The large decrease in leakage current was attributed to the formation of highly resistive layers, originating from compensating defect chemistry involved for La-doped films grown in oxidizing environment. Temperature-dependent leakage-current behavior was studied to investigate the conduction mechanism and explanations of the results were sought from Poole-Frenkel conduction mechanism. (C) 2001 American Institute of Physics.
引用
收藏
页码:111 / 113
页数:3
相关论文
共 17 条
[11]  
O'Dwyer J., 1973, THEORY ELECT CONDUCT
[12]  
Pond J. M., 1998, Integrated Ferroelectrics, V22, P317, DOI 10.1080/10584589808208052
[13]   Impact of microstructure on the electrical stress induced effects of pulsed laser ablated (Ba, Sr)TiO3 thin films [J].
Saha, S ;
Krupanidhi, SB .
JOURNAL OF APPLIED PHYSICS, 2000, 87 (06) :3056-3062
[14]   Study of the electrical properties of pulsed laser ablated (Ba0.5Sr0.5)TiO3 thin films [J].
Saha, S ;
Krupanidhi, SB .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 57 (02) :135-146
[15]  
SAHA S, 2001, THESIS INDIAN I SCI
[16]  
Stowell S, 1998, J KOREAN PHYS SOC, V32, pS1587
[17]  
WASER R, 1994, FERROELECTRIC THIN F, P47